Automatic Test Case Generation for Vulnerability Analysis of Galois Field Arithmetic Circuits
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| Title | Automatic Test Case Generation for Vulnerability Analysis of Galois Field Arithmetic Circuits |
| Publication Type | Conference Paper |
| Year of Publication | 2021 |
| Authors | Gupt KKumar, Kshirsagar M, Sullivan JP, Ryan C |
| Conference Name | 2021 IEEE 5th International Conference on Cryptography, Security and Privacy (CSP) |
| Date Published | 02 |
| Conference Location | Onlinc |
| URL | https://ieeexplore.ieee.org/document/9357567 |
| DOI | 10.1109/CSP51677.2021.9357567 |
