Endurance prediction and error Reduction in NAND flash using machine learning
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Title | Endurance prediction and error Reduction in NAND flash using machine learning |
Publication Type | Conference Paper |
Year of Publication | 2017 |
Authors | Fitzgerald B, Hogan D, Ryan C, Sullivan J |
Conference Name | 17th Non-Volatile Memory Technology Symposium (NVMTS) |
Date Published | 08/2017 |
DOI | 10.1109/NVMTS.2017.8171304 |