Defect Data Analysis as Input for Software Process Improvement
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Title | Defect Data Analysis as Input for Software Process Improvement |
Publication Type | Conference Paper |
Year of Publication | 2012 |
Authors | Raninen A, Toroi T., Vainio H., Ahonen J. |
Conference Name | Proceedings of 13th International Conference on Product-Focused Software Development and Process ImprovementProceedings of 13th International Conference on Product-Focused Software Development and Process Improvement |
Date Published | 2012 |
Conference Location | Madrid, Spain |
URL | https://sharepoint.lero.ie/Publications/2012/Conference%20Paper/2012-Raninen-Defect%20Data%20Analysis%20as%20Input.pdf |